"Yield analysis for repairable embedded memories."

Anuja Sehgal et al. (2003)

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DOI: 10.1109/ETW.2003.1231666

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Anuja Sehgal, Aishwarya Dubey, Erik Jan Marinissen, Clemens Wouters, Harald P. E. Vranken, Krishnendu Chakrabarty:
Yield analysis for repairable embedded memories. ETW 2003: 35-40

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