"Characterization of the EME of integrated circuits with the help of the ..."

Timm Ostermann, Bernd Deutschmann (2003)

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DOI: 10.1109/ETW.2003.1231680

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Timm Ostermann, Bernd Deutschmann:
Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]. ETW 2003: 132-137

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