"IoT: Source of test challenges."

Erik Jan Marinissen et al. (2016)

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DOI: 10.1109/ETS.2016.7519331

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes:
IoT: Source of test challenges. ETS 2016: 1-10

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