"Silent Data Corruption: Test or Reliability Problem?"

Erik Jan Marinissen et al. (2024)

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DOI: 10.1109/ETS61313.2024.10567773

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-05

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Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen:
Silent Data Corruption: Test or Reliability Problem? ETS 2024: 1-7

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