"Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V."

Seyedeh Maryam Ghasemi et al. (2024)

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DOI: 10.1109/ETS61313.2024.10567607

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-04

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Seyedeh Maryam Ghasemi, Jonas Krautter, Tara Gheshlaghi, Sergej Meschkov, Dennis R. E. Gnad, Mehdi B. Tahoori:
Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V. ETS 2024: 1-6

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