"An optical/electrical test system for 100Gb/s optical interconnection ..."

Tasuku Fujibe et al. (2016)

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DOI: 10.1109/ETS.2016.7519282

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Tasuku Fujibe, Kazuki Shirahata, Takeshi Mizushima, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda:
An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. ETS 2016: 1-2

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