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Takeshi Mizushima

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Conference and Workshop Papers

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2016
[c3]
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Takeshi Mizushima, Kazuki Shirahata, Tasuku Fujibe, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda:
An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production. ATS 2016: 130
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Kazuki Shirahata, Takeshi Mizushima, Tasuku Fujibe, Hidenobu Matsumura, Tomoyuki Itakura, Masahiro Ishida, Daisuke Watanabe, Shin Masuda:
An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware. ATS 2016: 263-268
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Tasuku Fujibe, Kazuki Shirahata, Takeshi Mizushima, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda:
An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. ETS 2016: 1-2

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