"On the correlation between the retention time of FBRAM and the ..."

Eddy Simoen et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343402

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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  - conf/essderc/SimoenAVJCAARTCF12
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  - https://dblp.org/rec/conf/essderc/SimoenAVJCAARTCF12
Eddy Simoen, Marc Aoulaiche, Anabela Veloso, M. Jurczak, Cor Claeys, L. Mendes Almeida, Maria Glória Caño de Andrade, A. Luque Rodriguez, J. A. Jimenez Tejada, Christian Caillat, Pierre Fazan:
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs. ESSDERC 2012: 338-341

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