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"Study of surface weak spots on SiC Schottky Diodes under specific ..."

Javier Leon et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948841

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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  - conf/essderc/LeonPVJG14
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Javier Leon, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà, Philippe Godignon:
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing. ESSDERC 2014: 385-388

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