"A failure-resilient xDSL line driver with on-chip degradation monitor."

Pieter De Wit, Georges G. E. Gielen (2011)

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DOI: 10.1109/ESSCIRC.2011.6044953

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Pieter De Wit, Georges G. E. Gielen:
A failure-resilient xDSL line driver with on-chip degradation monitor. ESSCIRC 2011: 247-250

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