"An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on ..."

Tobias Strauch (2019)

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DOI: 10.1109/DSD.2019.00018

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-23

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Tobias Strauch:
An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS). DSD 2019: 51-60

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