"Quantifying Defect-Mediated Electron Capture and Emission in Flexible ..."

J. A. Yang et al. (2024)

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DOI: 10.1109/DRC61706.2024.10605555

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-19

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J. A. Yang, Eros Reato, Theresia Knobloch, J.-S. Ko, Z. Zhang, Andrew J. Mannix, Krishna Saraswat, Tibor Grasser, Max Christian Lemme, Eric Pop:
Quantifying Defect-Mediated Electron Capture and Emission in Flexible Monolayer WS2 Field-Effect Transistors. DRC 2024: 1-2

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