"Neural Network Assisted Compact Model for Accurate Characterization of ..."

Jacob N. Rohan et al. (2019)

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DOI: 10.1109/DRC46940.2019.9046462

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-29

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Jacob N. Rohan, Pingping Zhuang, S. S. Teja Nibhanupudi, Sanjay Kumar Banerjee, Jaydeep P. Kulkarni:
Neural Network Assisted Compact Model for Accurate Characterization of Cycle-to-cycle Variations in 2-D $h$-BN based RRAM devices. DRC 2019: 103-104

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