"Read Noise Analysis in Analog Conductive-Metal-Oxide/HfOx ReRAM Devices."

Davide G. F. Lombardo et al. (2024)

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DOI: 10.1109/DRC61706.2024.10643760

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-31

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Davide G. F. Lombardo, Mamidala Saketh Ram, Tommaso Stecconi, Wooseok Choi, Antonio La Porta, Donato Francesco Falcone, Bert J. Offrein, Valeria Bragaglia:
Read Noise Analysis in Analog Conductive-Metal-Oxide/HfOx ReRAM Devices. DRC 2024: 1-2

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