"Bias Stress Stability of ITO Transistors and its Dependence on Dielectric ..."

Lauren Hoang et al. (2022)

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DOI: 10.1109/DRC55272.2022.9855789

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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Lauren Hoang, Alwin Daus, Sumaiya Wahid, Jimin Kwon, Jung-Soo Ko, Shengjun Qin, Mahnaz Islam, Krishna C. Saraswat, H.-S. Philip Wong, Eric Pop:
Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. DRC 2022: 1-2

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