default search action
"Comprehensive Modeling of VLSI Test."
Thomas A. Ziaja, Earl E. Swartzlander Jr. (1996)
- Thomas A. Ziaja, Earl E. Swartzlander Jr.:
Comprehensive Modeling of VLSI Test. DFT 1996: 159-167
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.