"Non-Intrusive Test Compression for SOC Using Embedded FPGA Core."

Gang Zeng, Hideo Ito (2004)

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DOI: 10.1109/DFT.2004.42

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Gang Zeng, Hideo Ito:
Non-Intrusive Test Compression for SOC Using Embedded FPGA Core. DFT 2004: 413-421

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