"Improving the Detectability of Resistive Open Faults in Scan Cells."

Fan Yang et al. (2009)

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DOI: 10.1109/DFT.2009.30

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Improving the Detectability of Resistive Open Faults in Scan Cells. DFT 2009: 383-391

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