"Trade-offs between yield and reliability enhancement [VLSI]."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Arunshankar Venkataraman, Israel Koren (1996)

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DOI: 10.1109/DFTVS.1996.571993

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Arunshankar Venkataraman, Israel Koren:
Trade-offs between yield and reliability enhancement [VLSI]. DFT 1996: 68-76

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