"Neural Networks-Based Parametric Testing of Analog IC."

Viera Stopjaková et al. (2002)

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DOI: 10.1109/DFTVS.2002.1173538

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Viera Stopjaková, Daniel Micusík, Lubica Benusková, Martin Margala:
Neural Networks-Based Parametric Testing of Analog IC. DFT 2002: 408-418

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