"Binning for IC Quality: Experimental Studies on the SEMATECH Data."

Adit D. Singh et al. (1998)

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DOI: 10.1109/DFTVS.1998.732145

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh:
Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10

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