"Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield."

Nohpill Park, Fabrizio Lombardi (1999)

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DOI: 10.1109/DFTVS.1999.802885

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nohpill Park, Fabrizio Lombardi:
Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield. DFT 1999: 192-200

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