"Machine learning based test pattern analysis for localizing critical power ..."

Harshad Dhotre et al. (2017)

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DOI: 10.1109/DFT.2017.8244464

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/DhotreEDPD17
Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler:
Machine learning based test pattern analysis for localizing critical power activity areas. DFT 2017: 1-6

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