"Test Generation for Open Defects in CMOS Circuits."

Narendra Devta-Prasanna et al. (2006)

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DOI: 10.1109/DFT.2006.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz:
Test Generation for Open Defects in CMOS Circuits. DFT 2006: 41-49

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