"X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated ..."

S. Bouat et al. (2023)

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DOI: 10.1109/DFT59622.2023.10313553

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-21

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S. Bouat, Stéphanie Anceau, Laurent Maingault, Jessy Clédière, Luc Salvo, Rémi Tucoulou:
X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits. DFT 2023: 1-6

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