"Random Pattern Testability of the Open Defect Detection Method using ..."

Hiroyuki Yotsuyanagi et al. (2002)

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DOI: 10.1109/DELTA.2002.994656

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada:
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391

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