"Optimal Memory Address Seeds for Pattern Sensitive Faults Detection."

S. V. Yarmolik, Bartosz Sokol (2006)

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DOI: 10.1109/DDECS.2006.1649616

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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S. V. Yarmolik, Bartosz Sokol:
Optimal Memory Address Seeds for Pattern Sensitive Faults Detection. DDECS 2006: 220-221

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