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ORCIDSvetlana V. Yarmolik
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- affiliation: Belarusian State University, Minsk, Belarus
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2010 – 2019
- 2015
[j9]Vyacheslav N. Yarmolik, Ireneusz Mrozek
, Svetlana V. Yarmolik:
Controlled method of random test synthesis. Autom. Control. Comput. Sci. 49(6): 395-403 (2015)- 2014
- [j8]Vyacheslav N. Yarmolik, Svetlana V. Yarmolik:
Address sequences. Autom. Control. Comput. Sci. 48(4): 207-213 (2014) - 2013
- [j7]V. N. Yarmolik, S. V. Yarmolik:
Generating modified Sobol sequences for multiple run march memory tests. Autom. Control. Comput. Sci. 47(5): 242-247 (2013) - [c4]Ireneusz Mrozek, Svetlana V. Yarmolik:
Analyses of two run march tests with address decimation for BIST procedure. EWDTS 2013: 1-4 - 2011
- [j6]S. V. Yarmolik, V. N. Yarmolik:
The synthesis of probability tests with a small number of kits. Autom. Control. Comput. Sci. 45(3): 133-141 (2011) - 2010
- [j5]S. V. Yarmolik, Vyacheslav N. Yarmolik:
Generalized adaptive signature analysis. Autom. Control. Comput. Sci. 44(4): 227-233 (2010)
2000 – 2009
- 2009
- [j4]S. V. Yarmolik, V. N. Yarmolik:
Nondestructive RAM testing based on multiple signature comparison. Autom. Control. Comput. Sci. 43(4): 173-178 (2009) - 2008
- [j3]S. V. Yarmolik, Alexander N. Kurbatski, V. N. Yarmolik:
Determination of the optimal initial states for multiple-run RAM testing. Autom. Control. Comput. Sci. 42(3): 120-125 (2008) - [j2]Svetlana V. Yarmolik:
Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests. Int. J. Appl. Math. Comput. Sci. 18(3): 329-339 (2008) - 2007
- [j1]S. V. Yarmolik:
Generation of address sequences for effective random access memory testing. Autom. Control. Comput. Sci. 41(6): 337-342 (2007) - [c3]S. V. Yarmolik, Ireneusz Mrozek, Bartosz Sokol:
Address Sequences Generation for Multiple Run Memory Testing. CISIM 2007: 341-344 - 2006
- [c2]S. V. Yarmolik, Bartosz Sokol:
Optimal Memory Address Seeds for Pattern Sensitive Faults Detection. DDECS 2006: 220-221 - [c1]Bartosz Sokol, S. V. Yarmolik:
Address Sequences for March Tests to Detect Pattern Sensitive Faults. DELTA 2006: 354-360
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