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"Test pattern decompression in parallel scan chain architecture."

Martin Chloupek et al. (2013)

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DOI: 10.1109/DDECS.2013.6549820

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/ddecs/ChloupekJNR13
Martin Chloupek, Jiri Jenícek, Ondrej Novák, Martin Rozkovec:
Test pattern decompression in parallel scan chain architecture. DDECS 2013: 219-223

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