"A Signature Test Framework for Rapid Production Testing of RF Circuits."

Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee (2002)

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DOI: 10.1109/DATE.2002.998268

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee:
A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE 2002: 186-191

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