"Test preparation methodology for high coverage of physical defects in CMOS ..."

Marcelino B. Santos et al. (1995)

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DOI: 10.1109/EDTC.1995.470325

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-05

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Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira:
Test preparation methodology for high coverage of physical defects in CMOS digital ICs. ED&TC 1995: 604

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