"Reduction of detected acceptable faults for yield improvement via ..."

Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer (2007)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2018-11-28

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Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
Reduction of detected acceptable faults for yield improvement via error-tolerance. DATE 2007: 1599-1604

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