"VLSI Circuit Testing Using an Adaptive Optimization Model."

Philip S. Yu, C. Mani Krishna, Yann-Hang Lee (1987)

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DOI: 10.1145/37888.37948

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-10

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Philip S. Yu, C. Mani Krishna, Yann-Hang Lee:
VLSI Circuit Testing Using an Adaptive Optimization Model. DAC 1987: 399-406

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