"Reliability-driven layout decompaction for electromigration failure ..."

Goeran Jerke, Jens Lienig, Jürgen Scheible (2004)

> Home

Details and statistics

DOI: 10.1145/996566.996618

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/JerkeLS04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/JerkeLS04
Goeran Jerke, Jens Lienig, Jürgen Scheible:
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs. DAC 2004: 181-184

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.