"Improving compute in-memory ECC reliability with successive correction."

Brian Crafton et al. (2022)

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DOI: 10.1145/3489517.3530526

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Brian Crafton, Zishen Wan, Samuel Spetalnick, Jong-Hyeok Yoon, Wei Wu, Carlos Tokunaga, Vivek De, Arijit Raychowdhury:
Improving compute in-memory ECC reliability with successive correction. DAC 2022: 745-750

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