"NBTI in FinFET Circuits under the Temperature Effect Inversion."

Warin Sootkaneung et al. (2016)

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DOI: 10.1109/CSE-EUC-DCABES.2016.206

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Warin Sootkaneung, Pipatphon Lapamonpinyo, Sasithorn Chookaew, Suppachai Howimanporn:
NBTI in FinFET Circuits under the Temperature Effect Inversion. CSE/EUC/DCABES 2016: 343-350

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