"Impact of Process Mismatch and Device Aging on SR-Latch Based True Random ..."

Javad Bahrami et al. (2024)

> Home

Details and statistics

DOI: 10.1007/978-3-031-57543-3_10

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/cosade/BahramiEGDK24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cosade/BahramiEGDK24
Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators. COSADE 2024: 177-196

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.