"An Automatic Test Generation System for Large Scale Gate Arrays."

Takashi Aikyo et al. (1986)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2006-06-28

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  dblp key:
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  - https://dblp.org/rec/conf/compcon/AikyoHIKF86
Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii:
An Automatic Test Generation System for Large Scale Gate Arrays. COMPCON 1986: 445-451

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