"An on-chip all-digital measurement circuit to characterize phase-locked ..."

Dennis Michael Fischette, Richard Joseph DeSantis, John H. Lee (2009)

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DOI: 10.1109/CICC.2009.5280739

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Dennis Michael Fischette, Richard Joseph DeSantis, John H. Lee:
An on-chip all-digital measurement circuit to characterize phase-locked loop response in 45-nm SOI. CICC 2009: 609-612

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