"Process variation in nano-scale memories: failure analysis and process ..."

Amit Agarwal, Bipul C. Paul, Kaushik Roy (2004)

> Home

Details and statistics

DOI: 10.1109/CICC.2004.1358819

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/cicc/AgarwalPR04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cicc/AgarwalPR04
Amit Agarwal, Bipul C. Paul, Kaushik Roy:
Process variation in nano-scale memories: failure analysis and process tolerant architecture. CICC 2004: 353-356

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.