"Looking Inside the Wires: Understanding Museum Visitor Learning with an ..."

Elham Beheshti et al. (2017)

> Home

Details and statistics

DOI: 10.1145/3025453.3025479

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/chi/BeheshtiKEH17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/chi/BeheshtiKEH17
Elham Beheshti, David Kim, Gabrielle Ecanow, Michael S. Horn:
Looking Inside the Wires: Understanding Museum Visitor Learning with an Augmented Circuit Exhibit. CHI 2017: 1583-1594

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.