"Evolving More Testable Digital Combinational Circuits."

Nahid Mirzaie, Seyyed Javad Seyyed Mahdavi, Karim Mohammadi (2010)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2010-12-06

- no documents available
- export record
  dblp key:
  - conf/cdes/MirzaieMM10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cdes/MirzaieMM10
Nahid Mirzaie, Seyyed Javad Seyyed Mahdavi, Karim Mohammadi:
Evolving More Testable Digital Combinational Circuits. CDES 2010: 40-45

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.