"Yield and Reliability Enhancement for VLSI Design."

Chung-Han Chen et al. (2009)

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type: Conference or Workshop Paper

metadata version: 2024-04-02

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Chung-Han Chen, Saritha Akavaram, Hira N. Narang, Fan Wu:
Yield and Reliability Enhancement for VLSI Design. CDES 2009: 48-51

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