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"Defect Identification by Sensor Network Under Uncertainties."
Tomonari Furukawa et al. (2010)
- Tomonari Furukawa, Jinquan Cheng, Shen Hin Lim
, Fei Xu, Ryuji Shioya:
Defect Identification by Sensor Network Under Uncertainties. BWCCA 2010: 155-158
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