"Towards Log-Driven Monitoring of Technical Degradation: An ERP Perspective."

Pieter van de Griend, Rob J. Kusters, Jos J. M. Trienekens (2023)

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DOI: 10.1007/978-3-031-36757-1_24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Pieter van de Griend, Rob J. Kusters, Jos J. M. Trienekens:
Towards Log-Driven Monitoring of Technical Degradation: An ERP Perspective. BMSD 2023: 330-339

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