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Pieter van de Griend

P. A. van de Griend

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2020 – today

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2023
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Pieter van de Griend, Rob J. Kusters, Jos J. M. Trienekens:
Towards Log-Driven Monitoring of Technical Degradation: An ERP Perspective. BMSD 2023: 330-339
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Pieter van de Griend, Rob J. Kusters, Jos J. M. Trienekens:
Defect repair efficacy in ERP production systems. CENTERIS/ProjMAN/HCist 2023: 1353-1360

2010 – 2019

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2012
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P. A. van de Griend, Rob J. Kusters:
Integration test effort in sap r/3 systems. J. Softw. Evol. Process. 24(4): 421-435 (2012)

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