"Inspection of unexpected defective products by semi-supervised learning ..."

Masahiro Nakahara et al. (2022)

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DOI: 10.1109/BIGDATA55660.2022.10020241

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-18

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Masahiro Nakahara, Yuichi Mashiba, Ryusuke Miyamoto, Yuki Fujita, Hisashi Ishida, Keiichi Zempo:
Inspection of unexpected defective products by semi-supervised learning based on a probability density function in high-yield food production. IEEE Big Data 2022: 6784-6786

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