default search action
"Design of a Test Processor for Asynchronous Chip Test."
Steffen Zeidler et al. (2011)
- Steffen Zeidler, Christoph Wolf, Milos Krstic, Frank Vater, Rolf Kraemer:
Design of a Test Processor for Asynchronous Chip Test. Asian Test Symposium 2011: 244-250
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.