"An Efficient Peak Power Reduction Technique for Scan Testing."

Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang (2007)

Details and statistics

DOI: 10.1109/ATS.2007.54

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

a service of  Schloss Dagstuhl - Leibniz Center for Informatics