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2010 – 2019
- 2015
[c9]Meng-Fan Wu, Bo Yang, Fei-Fei Hu, Liu-Wen Liao:
Analyses on spatiotemporal patterns of impervious surface coverage in Changsha metropolitan area. Geoinformatics 2015: 1-6- [c8]Che-Hao Li, Meng-Fan Wu, Chi-Hsiang Lin, Chun-Ting Lin:
W-band OFDM RoF system with simple envelope detector down-conversion. OFC 2015: 1-3 - [c7]Huan-Ching Liu, Chi-Hsiang Lin, Chun-Ting Lin, Chia-Chien Wei, Hou-Tzu Huang, Hsun-Hao Hsu, Meng-Fan Wu, Sien Chi:
Simple receiving scheme in 100-GHz DD OFDM RoF systems employing low-sampling-rate ADCs and digital preprocess. OFC 2015: 1-3 - 2010
- [c6]Meng-Fan Wu, Hsin-Cheih Pan, Teng-Han Wang, Jiun-Lang Huang, Kun-Han Tsai, Wu-Tung Cheng:
Improved weight assignment for logic switching activity during at-speed test pattern generation. ASP-DAC 2010: 493-498 - [c5]Chun-Yong Liang, Meng-Fan Wu, Jiun-Lang Huang:
Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing. Asian Test Symposium 2010: 361-366 - [c4]Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli:
A scalable quantitative measure of IR-drop effects for scan pattern generation. ICCAD 2010: 162-167
2000 – 2009
- 2009
- [j2]Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang:
LPTest: a Flexible Low-Power Test Pattern Generator. J. Electron. Test. 25(6): 323-335 (2009) - [j1]Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase:
Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1767-1776 (2009) - 2008
- [c3]Yi-Tsung Lin, Meng-Fan Wu, Jiun-Lang Huang:
PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment. ATS 2008: 391-396 - [c2]Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase:
Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. ITC 2008: 1-10 - 2007
- [c1]Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang:
An Efficient Peak Power Reduction Technique for Scan Testing. ATS 2007: 111-114
Coauthor Index
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